Why Cleaning Matters
Probe tip contamination leads to unstable contact resistance (CRES), resulting in false failures and yield loss. Even a 1% drop in first-pass yield can translate into significant revenue impact for semiconductor manufacturers.
Stable Contact Integrity for Reliable Testing
Maintain consistent CRES to reduce false fails and improve test accuracy.
Extended Probe Card Lifetime
Minimise wear and contamination to support longer high-volume usage.
Controlled Contamination at Probe Interface
Reduce particle interference for stable, repeatable measurements.
Higher Uptime & Equipment Efficiency
Increase prober availability by reducing cleaning-related downtime.
Our Products
Designed for different cleaning requirements across wafer test applications:
Elastomer Probe Card Cleaning Films
Gel-Probe Card Cleaning
- Custom coating of highly engineered elastomer films for semiconductor applications.
- Customizable probecard cleaning wafer and cleaning sheet applications.
Universal & Pocketless Carriers
Textured Device Carrier Products
- Pocketless carriers and transport products for KGD and other devices
- Universal Fixture for device handling in-
process, singulated die testing, and shipping.
Small Die Shipping & Handling
Vacuum Release Carriers
- Automated pick & place applications for bare die and devices ranging from <250 micron to 75mm in size.
- Handling small components or large assembled modules.
- Suitable for transport and handling MEMs Probes.
Die Wafer & Panel Shipping & Handling
Large Substrate Vacuum Release Carriers™
- Shipping and handling full or partial wafers, panels, and OTHER substrates from 75mm to 450mm.
- Suitable for KGD, singulated die, and film frame loaded devices.
Your Partner in Test Yield Optimization
At Acceltest, we provide high-performance solutions for wafer testing environments—helping fabs reduce contamination, stabilise contact resistance, and maximise first-pass yield. Our portfolio includes proven technologies from global leaders like Gel-Pak.
Optimise Your Test Performance Today
Looking to improve wafer test yield and reliability? Contact our team for the right solution.
